Tantalum
Element density: 16.65 g/cm3
Electron configuration: [Xe]4f145d36s2
Oxidation states: +5
Edges
Explore electron energy loss spectroscopy (EELS) reference spectra, featuring major and minor edges used for elemental identification and chemical state analysis in materials research.
Major edges | |||
|---|---|---|---|
L3 | 9881 |
|
|
M4 | 1793 |
|  |
M5 | 1735 |
| |
O2 | 45 |  | |
O3 | 36 | | |
Minor edges | |||
|---|---|---|---|
L1 | 11682 |
|
|
L2 | 11136 |
|
|
M1 | 2708 |
|  |
M2 | 2469 |  |  |
M3 | 2194 |  |  |
N1 | 566 |
| |
N2 | 465 |
| |
N3 | 405 |
| |
N4 | 241 |
|  |
N5 | 229 |
| |
O1 | 71 |
| |
Considerations
The M4,5-edge overlaps with Si K-edge and the M-edges of Hf and W. Use MLLS fitting or model based EELS to separate these edges.
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Related spectral data
Ta oxide amorphous thin film (0 – 3910 eV)
Material analyzed: TaO
Related elements: Oxygen, Tantalum
Data contributor: Gatan
Beam energy (keV): 200
Nominal energy range (eV): 0 – 3910
Collection semi-angle effective (mrad): 100
Notes: Serial EELS; zero-loss peak intensity = 3.56e9; total elastic int. / zero-loss int. = 0.37; gain change factor = 395; 60 ms dwell; 60 sweeps; fuzzy rings
Applications
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