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Technologies
What is EELS
Why EELS
Overview
Spatial Resolution
Compositional Sensitivity
Chemical Sensitivity
Ease of Use
EELS Techniques
Overview
Spectroscopy
EFTEM
DualEELS
Spectrum Imaging
Instrumentation
Overview
Gatan Imaging Filter (GIF)
TEM-GIF Integration
Spectroscopy Operation
Applications
Overview
Identify Elements
Quantify Elements
Locate Elements
Determine Chemical State
Enhance Contrast
Solutions
Overview
Getting Started
Overview
Sample Requirements
TEM Setup for Analysis
Technique Selection
Collection Angle Considerations
Spectroscopy
Overview
Locate the Beam
Focus the Spectrometer
Acquire a Spectrum
Set Energy Range
Optimize Spectrum
DualEELS Workflow
Quantification
Overview
Choose Suitable Edges for Quantification
Identify Edge Features in Spectrum
Assess Sample Thickness
Plural Scattering and Sample Thickness
Extract Signal
Quantify Extracted Signal
EFTEM
Overview
Basic Preparation
Mapping Workflow
Overview
Zero-Loss Image
Unfiltered Image
Thickness Map
Electron Spectroscopic Imaging
Jump-Ratio Map
Elemental Map
EFTEM MultiMap
Optimize Maps
Spectrum Imaging
Overview
STEM SI Workflow
Overview
STEM SI Setup
Survey Image
Select and Survey ROI
Flow Control
Visual Feedback
Adjustments
EFTEM SI Workflow
Overview
EFTEM SI Setup
Acquisition Flow and Feedback
EFTEM SI Artifact Correction
Advanced SI
Overview
Multiple Linear Least Squares
Non-Linear Least Squares
Software and Scripting
Overview
DigitalMicrograph 3 Setup and First Python Script
Customizing the Installed Python Environment
Multisignal Spectrum Imaging
Live Oxidation State Mapping and In-Situ Heating
EELS Quantification Using Internal Standards
EELS Quantification Using Concurrent Standards
Resources
Overview
EELS Atlas
Application Notes
EM Academy
FAQs
Glossary
Publications
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