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Locate the Beam

Note: The ZLP is very intense and can easily saturate the detector. For systems with a fast electrostatic shutter, it is a simple matter of enabling Auto exposure mode or manually changing to a shorter exposure time to prevent saturation. On other systems, you may need to reduce the beam current. In TEM image mode, you can easily adjust the condenser, but in scanning (S)TEM or diffraction mode, it is not as simple. Changing the spot size or emitter properties may be necessary.

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Microscope system palette
   

Note: The ZLP is very intense and can easily saturate the detector. For systems with a fast electrostatic shutter, it is a simple matter of enabling Auto exposure mode or manually changing to a shorter exposure time to prevent saturation. On other systems, you may need to reduce the beam current. In TEM image mode, you can easily adjust the condenser, but in scanning (S)TEM or diffraction mode, it is not as simple. Changing the spot size or emitter properties may be necessary.

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