Advanced SI

Once acquired, you can treat a 3D electron energy loss spectroscopy (EELS) dataset $I(E,x,y)$
as a collection of spectra or sequence of images irrespective of acquisition mode. You can apply conventional electron energy loss spectral processing techniques (e.g., Fourier-log deconvolution, elemental mapping), image processing (e.g., jump-ratio imaging, MSA), or progress to use more advanced analysis techniques.

• Linear least-squares fitting
• Multivariate statistical analysis

References

Leapman, R. D.; Swyt, C. R. Separation of overlapping core edges in electron energy loss spectra by multiple-least-squares fitting. Ultramicroscopy. 26:393 – 404.