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Yttrium

Element density: 4.47 g/cm3
Electron configuration: [Kr]4d15s2
Oxidation states: +3

Yttrium

Edges

Explore electron energy loss spectroscopy (EELS) reference spectra, featuring major and minor edges used for elemental identification and chemical state analysis in materials research. 
 

Major edges

K

17038

 

Minor_Abrupt Onset

L2

2156

Major_Sharp Peak
Major_Delayed Minimum

L3

2080

Major_Sharp Peak
Major_Delayed Minimum

M4

160

 

Major_Delayed Minimum

M5

157

 

Major_Delayed Minimum

N2,3

26

Major_Broad Peak
Major_Delayed Minimum

 

Minor edges

L1

2373

 

Minor_Abrupt Onset

M1

394

 

Very Weak_Abrupt Onset

M2

312

Minor_Sharp Peak
Very Weak_Delayed Minimum

M3

300

Minor_Sharp Peak
Very Weak_Delayed Minimum

N1

45

 

Very Weak_Abrupt Onset

Considerations

M4,5-edges at low energy and delayed. L-edges typically give high SNR for mapping.

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Related spectral data

Y2O3 thin film (0 – 180 eV)
   

Y2O3 thin film (0 – 180 eV)

Material analyzed: Y2O3

Related elements: Yttrium, Oxygen

Data contributor: Gatan

Beam energy (keV): 200

Nominal energy range (eV): 0 – 180

Collection semi-angle effective (mrad): 100

 

Notes: Serial EELS; 20 ms dwell 5 sweeps

 

Y2O3 thin film (0 – 950 eV)
   

Y2O3 thin film (0 – 950 eV)

Material analyzed: Y2O3

Related elements: Yttrium, Oxygen

Data contributor: Gatan

Beam energy (keV): 200

Nominal energy range (eV): 0 – 950

Collection semi-angle effective (mrad): 100

 

Notes: Serial EELS; zero-loss peak intensity = 8.28e8; total elastic int. / zero-loss int. = 0.73; gain change factor = 594; 35 sweeps 30 ms dwell

 

Y2O3(1880-2890eV)
   

Y2O3 thin film (1880 – 2890 eV)

Material analyzed: Y2O3

Related elements: Yttrium, Oxygen

Data contributor: Gatan

Beam energy (keV): 120

Nominal energy range (eV): 1880 – 2890

Collection semi-angle effective (mrad): 21

 

Notes: Serial EELS; total elastic int. / zero-loss int. = 0.4

 

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