Thulium
Element density: 9.32 g/cm3
Electron configuration: [Xe]4f136s2
Oxidation states: +3
Edges
Explore electron energy loss spectroscopy (EELS) reference spectra, featuring major and minor edges used for elemental identification and chemical state analysis in materials research.
Major edges | |||
|---|---|---|---|
L3 | 8648 |
|
|
M4 | 1515 |  | <  |
M5 | 1468 |  | |
N4,5 | 180 |  | |
O2,3 | 32 | | |
Minor edges | |||
|---|---|---|---|
L1 | 10116 |
|
|
L2 | 9617 |
|
|
M1 | 2307 |
|  |
M2 | 2090 |  |  |
M3 | 1885 | | |
N1 | 472 |
| |
N2 | 386 | | |
N3 | 337 | | |
O1 | 53 |
| |
Considerations
Sharp M4,5-edges allow for trace analysis.
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Related spectral data
Tm2O3 thin film (0 – 380 eV)
Material analyzed: Tm2O3
Related elements: Thulium, Oxygen
Data contributor: Gatan
Beam energy (keV): 200
Nominal energy range (eV): 0 – 380
Collection semi-angle effective (mrad): 100
Notes: Serial EELS; zero-loss peak intensity = 1.30e9; total elastic int. / zero-loss int. = 0.41; gain change factor = 788; 12 sweeps 20 ms dwell
