Palladium
Element density: 12.02 g/cm3
Electron configuration: [Kr]4d10
Oxidation states: +2,4
Edges
Explore electron energy loss spectroscopy (EELS) reference spectra, featuring major and minor edges used for elemental identification and chemical state analysis in materials research.
Major edges | |||
|---|---|---|---|
K | 24350 |
|
|
L2 | 3330 |  |  |
L3 | 3173 | | |
M4 | 340 |
|  |
M5 | 335 |
| |
N2,3 | 51 |  | |
Minor edges | |||
|---|---|---|---|
L1 | 3604 |
|  |
M1 | 670 |
| |
M2 | 559 | |  |
M3 | 532 | | |
N1 | 86 |
| |
Considerations
L-edges are often easier to map than stronger M-edges due to more stable background.
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Related spectral data
Pd thin film (0 – 180 eV)
Material analyzed: Pd
Related elements: Palladium
Data contributor: Gatan
Beam energy (keV): 200
Nominal energy range (eV): 0 – 180
Collection semi-angle effective (mrad): 100
Notes: Serial EELS; 30 sweeps 20 ms dwell
Pd thin film (0 – 910 eV)
Material analyzed: Pd
Related elements: Palladium
Data contributor: Gatan
Beam energy (keV): 200
Nominal energy range (eV): 0 – 910
Collection semi-angle effective (mrad): 100
Notes: Serial EELS; zero-loss peak intensity = 1.54e9; total elastic int. / zero-loss int. = 0.23; gain change factor = 542; 20 ms dwell; 80 sweeps
Pd thin film (3030 – 4040 eV)
Material analyzed: Pd
Related elements: Palladium
Data contributor: Gatan
Beam energy (keV): 120
Nominal energy range (eV): 3030 – 4040
Collection semi-angle effective (mrad): 15
Notes: Serial EELS; total elastic int. / zero-loss int. = 0.13
PdO thin film (0 – 920 eV)
Material analyzed: PdO
Related elements: Palladium, Oxygen
Data contributor: Gatan
Beam energy (keV): 200
Nominal energy range (eV): 0 – 920
Collection semi-angle effective (mrad): 100
Notes: Serial EELS; C contamination; zero-loss peak intensity = 1.34e9; total elastic int. / zero-loss int. = 0.33; gain change factor = 382; 190 sweeps 10 ms dwell
Applications
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