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Nickel

Element density: 8.91 g/cm3
Electron configuration: [Ar]3d84s2
Oxidation states: +2,3

Nickel

Edges

Explore electron energy loss spectroscopy (EELS) reference spectra, featuring major and minor edges used for elemental identification and chemical state analysis in materials research. 
 

 

Major edges

K

8333

 

Minor_Abrupt Onset

L2

872

Major_Sharp Peak
Major_Delayed Minimum

L3

855

Major_Sharp Peak
Major_Delayed Minimum

M2,3

68

Minor_Broad Peak
Major_Delayed Minimum

 

Minor edges

L1

1008

 

Minor_Abrupt Onset

M1

112

 

Very Weak_Abrupt Onset

Considerations

Rich ELNES structure in L2,3-edges. White line ratio and energy shift used to determine oxidation state.

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Related spectral data

NiO thin film (0-180 eV)
   

NiO thin film (0 – 180 eV)

Material analyzed: NiO

Related elements: Nickel, Oxygen

Data contributor: Gatan

Beam energy (keV): 200

Nominal energy range (eV): 0 – 180

Collection semi-angle effective (mrad): 100

 

Notes: Serial EELS; 20 sweeps 20 ms dwell

 

NiO thin film (0-960 eV)
   

NiO thin film (0 – 960 eV)

Material analyzed: NiO

Related elements: Nickel, Oxygen

Data contributor: Gatan

Beam energy (keV): 200

Nominal energy range (eV): 0 – 960

Collection semi-angle effective (mrad): 100

 

Notes: Serial EELS; zero-loss peak intensity = 7.50e9; total elastic int. / zero-loss int. = 0.47; gain change factor = 1073; 220 sweeps 20 ms dwell

 

Ni thin film (400 - 1410 eV)
   

NiO thin film (400 – 1410 eV)

Material analyzed: NiO

Related elements: Nickel, Oxygen

Data contributor: Gatan

Beam energy (keV): 200

Nominal energy range (eV): 400 – 1410

Collection semi-angle effective (mrad): 1.5

 

Notes: Serial EELS; 30 sweeps 20 ms dwell

 

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