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Neodymium

Element density: 7.01 g/cm3
Electron configuration: [Xe]4f46s2
Oxidation states: +3

Edges

Explore electron energy loss spectroscopy (EELS) reference spectra, featuring major and minor edges used for elemental identification and chemical state analysis in materials research. 
 

 

Major edges

L3

5964

 

 

M4

1000

Major_Sharp Peak
Major_Delayed Minimum

M5

978

Major_Sharp Peak
Major_Delayed Minimum

N4,5

5118

Major_Broad Peak
Major_Delayed Minimum

O2,3

21

Major_Broad Peak
Major_Delayed Minimum

 

Minor edges

L1

6835

 

 

L2

5964

 

 

M1

1575

 

Very Weak_Abrupt Onset

M2

1403

Intermittent_Sharp Peak
Very Weak_Delayed Minimum

M3

1297

Intermittent_Sharp Peak
Very Weak_Delayed Minimum

N1

315

 

Very Weak_Abrupt Onset

N2

225

Intermittent_Sharp Peak
Very Weak_Delayed Minimum

N3

225

Intermittent_Sharp Peak
Very Weak_Delayed Minimum

O1

38

 

 

Considerations

Sharp M4,5-edges allow for trace analysis.

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Related spectral data

Nd2O3 thin film (0 – 170 eV)
   

Nd2O3 thin film (0 – 170 eV)

Material analyzed: Nd2O3

Related elements: Neodymium, Oxygen

Data contributor: Gatan

Beam energy (keV): 200

Nominal energy range (eV): 0 – 170

Collection semi-angle effective (mrad): 100

 

Notes: Serial EELS; 10 sweeps 16.67 ms dwell; and several single channel intensity glitches in spectrum

 

Nd2O3 thin film (0 – 380 eV)
   

Nd2O3 thin film (0 – 380 eV)

Material analyzed: Nd2O3

Related elements: Neodymium, Oxygen

Data contributor: Gatan

Beam energy (keV): 200

Nominal energy range (eV): 0 – 380

Collection semi-angle effective (mrad): 100

 

Notes: Serial EELS; zero-loss peak intensity = 1.13e9; total elastic int. / zero-loss int. = 0.55; gain change factor = 634; 10 sweeps 20 ms dwell

 

Nd2O3 thin film (0 – 890 eV)
   

Nd2O3 thin film (0 – 890 eV)

Material analyzed: Nd2O3

Related elements: Neodymium, Oxygen

Data contributor: Gatan

Beam energy (keV): 200

Nominal energy range (eV): 0 – 890

Collection semi-angle effective (mrad): 100

 

Notes: Serial EELS; 25 sweeps 20 ms dwell

 

Nd2O3(0750-1760eV)_640x480
   

Nd2O3 thin film (750 – 1760 eV)

Material analyzed: Nd2O3

Related elements: Neodymium, Oxygen

Data contributor: Gatan

Beam energy (keV): 200

Nominal energy range (eV): 750 – 1760

Collection semi-angle effective (mrad): 100

 

Notes: Serial EELS; 30 sweeps 20 ms dwell

 

Media Gallery

Immerse yourself in the world of scientific discovery—explore striking microscopy images that reveal the unseen, alongside videos and tutorials showcasing the electron energy loss spectroscopy technology in action.

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