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Lanthanum

Element density: 6.15 g/cm3
Electron configuration: [Xe]5d16s2
Oxidation states: +3

Lanthanum

Edges

Explore electron energy loss spectroscopy (EELS) reference spectra, featuring major and minor edges used for elemental identification and chemical state analysis in materials research. 
 

 

Major edges

M4

849

Major_Sharp Peak
Major_Delayed Minimum

 

M5

832

Major_Sharp Peak
Major_Delayed Minimum

N4,5

99

Major_Broad Peak
Major_Delayed Minimum

O2,3

14

Major_Broad Peak
Major_Delayed Minimum

 

Minor edges

L1

6266

 

 

L2

5891

 

 

M1

1361

 

Very Weak_Abrupt Onset

M2

1204

Intermittent_Sharp Peak
Very Weak_Delayed Minimum

M3

1123

Intermittent_Sharp Peak
Very Weak_Delayed Minimum

N1

270

 

Very Weak_Abrupt Onset

N2

206

Intermittent_Sharp Peak
Very Weak_Delayed Minimum

N3

191

Intermittent_Sharp Peak
Very Weak_Delayed Minimum

O1

32

 

 

Considerations

Sharp M4,5-edges allow for trace analysis.

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Related spectral data

La2O3 thin film (0 – 380 eV)
   

La2O3 thin film (0 – 380 eV)

Material analyzed: La2O3

Related elements: Lanthanum, Oxygen

Data contributor: Gatan

Beam energy (keV): 200

Nominal energy range (eV): 0 – 380

Collection semi-angle effective (mrad): 100

 

Notes: Serial EELS; zero-loss peak intensity = 4.90e8; total elastic int. / zero-loss int. = 0.37; gain change factor = 826; 20 sweeps 10 ms dwell

 

La2O3 thin film (0 – 950 eV)
   

La2O3 thin film (0 – 950 eV)

Material analyzed: La2O3

Related elements: Lanthanum, Oxygen

Data contributor: Gatan

Beam energy (keV): 200

Nominal energy range (eV): 0 – 950

Collection semi-angle effective (mrad): 100

 

Notes: Serial EELS

 

La2O3 thin film (700 – 1710 eV)
   

La2O3 thin film (700 – 1710 eV)

Material analyzed: La2O3

Related elements: Lanthanum, Oxygen

Data contributor: Gatan

Beam energy (keV): 200

Nominal energy range (eV): 700 – 1710

Collection semi-angle effective (mrad): 100

 

Notes: Serial EELS; 40 sweeps 20 ms dwell

 

Media Gallery

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