Cerium
Element density: 6.69 g/cm3
Electron configuration: [Xe]4f15d16s2
Oxidation states: +3,4
Edges
Explore electron energy loss spectroscopy (EELS) reference spectra, featuring major and minor edges used for elemental identification and chemical state analysis in materials research.
Major edges | |||
|---|---|---|---|
L3 | 5723 |
|
|
M4 | 901 |  |  |
M5 | 883 | | |
N4,5 | 110 |  | |
O2,3 | 20 | | |
Minor edges | |||
|---|---|---|---|
L1 | 6549 |
|
|
L2 | 6164 |
|
|
M1 | 1435 |
|  |
M2 | 1273 |  |  |
M3 | 1185 | | |
N1 | 290 |
| |
N2 | 233 | | |
N3 | 207 | | |
O1 | 38 |
|
|
Considerations
Sharp M4,5-edges allow for trace analysis.
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Related spectral data
CeO2 thin film (0 – 80 eV)
Material analyzed: CeO2
Related elements: Cerium, Oxygen
Data contributor: Gatan
Beam energy (keV): 200
Nominal energy range (eV): 0 – 80
Collection semi-angle effective (mrad): 0
Notes: Serial EELS; zero-loss peak intensity = 1.27e9; total elastic int. / zero-loss int. = 0.25; gain change factor = 874; contamination; 20 sweeps 20 ms dwell
CeO2 thin film (0 – 380 eV)
Material analyzed: CeO2
Related elements: Cerium, Oxygen
Data contributor: Gatan
Beam energy (keV): 200
Nominal energy range (eV): 0 – 380
Collection semi-angle effective (mrad): 100
Notes: Serial EELS; zero-loss peak intensity = 1.27e9; total elastic int. / zero-loss int. = 0.25; gain change factor = 874; contamination; 20 sweeps 20 ms dwell
