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Tungsten

Element density: 19.25 g/cm3
Electron configuration: [Xe]4f145d46s2
Oxidation states: +6

Tungsten

Edges

Explore electron energy loss spectroscopy (EELS) reference spectra, featuring major and minor edges used for elemental identification and chemical state analysis in materials research. 
 

 

Major edges

L3

10207

 

 

M4

1872

 

Major_Delayed Minimum

M5

1809

 

Major_Delayed Minimum

O2

47

Minor_Broad Peak
Major_Delayed Minimum

O3

36

Minor_Broad Peak
Major_Delayed Minimum

 

Minor edges

L1

12100

 

 

L2

11544

 

 

M1

2820

 

Very Weak_Abrupt Onset

M2

2575

Very Weak_Sharp Peak
Very Weak_Delayed Minimum

M3

2281

Minor_Sharp Peak
Minor_Delayed Minimum

N1

595

 

Very Weak_Abrupt Onset

N2

492

Intermittent_Sharp Peak
Very Weak_Delayed Minimum

N3

425

Intermittent_Sharp Peak
Very Weak_Delayed Minimum

N4

259

 

Minor_Very Delayed

N5

245

 

Minor_Very Delayed

N6

37

 

 

N7

34

 

 

O1

77

 

Very Weak_Abrupt Onset

Considerations

The M4,5-edgesoverlaps with Si K-edge and the M-edges of Hf and Ta. Use MLLS fitting or model based EELS to separate these edges.

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Related spectral data

W(0-0180eV)
   

W electropolished foil (0 – 180 eV)

Material analyzed: W

Related elements: Tungsten

Data contributor: Gatan

Beam energy (keV): 200

Nominal energy range (eV): 0 – 180

Collection semi-angle effective (mrad): 100

 

Notes: Serial EELS; 10 ms dwell 15 sweeps; analog only

 

W electropolished foil (0 – 3910 eV)
   

W electropolished foil (0 – 3910 eV)

Material analyzed: W

Related elements: Tungsten

Data contributor: Gatan

Beam energy (keV): 200

Nominal energy range (eV): 0 – 3910

Collection semi-angle effective (mrad): 100

 

Notes: Serial EELS; zero-loss peak intensity = 1.08e9; total elastic int. / zero-loss int. = 0.19; gain change factor = 243; 150 sweeps 10 ms dwell; saturated zero-loss

 

Applications

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