Tin
Element density: 7.31 g/cm3
Electron configuration: [Kr]4d105s25p2
Oxidation states: +2,4
Edges
Explore electron energy loss spectroscopy (EELS) reference spectra, featuring major and minor edges used for elemental identification and chemical state analysis in materials research.
Major edges | |||
|---|---|---|---|
K | 29200 |
|
|
L2 | 4156 |  |  |
L3 | 3929 | | |
M4 | 493 |
| |
M5 | 485 |
| |
N4,5 | 24 |  | |
Minor edges | |||
|---|---|---|---|
L1 | 4465 |
|  |
M1 | 884 |
| |
M2 | 756 |
|  |
M3 | 714 |
|  |
N1 | 137 |
| |
N2,3 | 89 |
| |
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Related spectral data
Sn thin film (0 – 180 eV)
Material analyzed: Sn
Related elements: Tin
Data contributor: Gatan
Beam energy (keV): 200
Nominal energy range (eV): 0 – 180
Collection semi-angle effective (mrad): 100
Notes: Serial EELS; 20 sweeps 16.67 ms dwell; all analog
Sn thin film (0 – 910 eV)
Material analyzed: Sn
Related elements: Tin
Data contributor: Gatan
Beam energy (keV): 200
Nominal energy range (eV): 0 – 910
Collection semi-angle effective (mrad): 100
Notes: Serial EELS; zero-loss peak intensity = 6.44e8; total elastic int. / zero-loss int. = 0.48; gain change factor = 594; 70 sweeps 16.67 ms dwell
Applications
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