Crystallization in random orientations monitored via in-situ 4D STEM

Instruments used

The GIF Continuum^® K3^® with Stela^® enables high-fidelity energy-filtered diffraction and electron energy loss spectroscopy. The Stela hybrid-pixel camera, utilizing DECTRIS technology, enables a high signal-to-noise ratio (via electron counting) and high dynamic range diffraction imaging at fast frame rates (>16,000 fps). STEMx^® system, leveraging the eaSI™ technology, hardware synchronizes the scanning probe to the detector frame rate, enabling high throughput 4D scanning transmission electron microscopy (STEM) data acquisition and processing within the DigitalMicrograph^® software.

Background

The orientation of nanoparticles following crystallization on a support critically influences their properties and performance in catalysis, electronics, and sensors. While the behavior of perfectly monodisperse nanoparticles might be predictable from a single particle or an ensemble average, real systems are typically complex. Mapping the specific orientation of many individual particles over time is valuable, as each particle’s unique environment prevents a simple direct comparison between particles. However, repeated crystallization of a single particle does allow for the direct comparison of its orientations over multiple cycles. Observing multiple particles repeatedly provides better statistics and insights into which particles exhibit typical behavior.