Chromium
Element density: 7.14 g/cm3
Electron configuration: [Ar]3d54s1
Oxidation states: +2,3,6
Edges
Explore electron energy loss spectroscopy (EELS) reference spectra, featuring major and minor edges used for elemental identification and chemical state analysis in materials research.
Major edges | |||
|---|---|---|---|
K | 5989 |
|
 |
L2 | 584 |  |  |
L3 | 575 | | |
M2,3 | 43 |  | |
Minor edges | |||
|---|---|---|---|
L1 | 695 |
| |
M1 | 74 |
|  |
Considerations
Rich ELNES structure in L2,3-edges. White line ratio and energy shift used to determine oxidation state.
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Related spectral data
Slightly oxidized Cr thin film (0 – 180 eV)
Material analyzed: Cr
Related elements: Chromium
Data contributor: Gatan
Beam energy (keV): 200
Nominal energy range (eV): 0 – 180
Collection semi-angle effective (mrad): 100
Notes: Serial EELS; analog only; 20 sweeps 16.67 ms dwell
Slightly oxidized Cr thin film (0 – 920 eV)
Material analyzed: Cr
Related elements: Chromium
Data contributor: Gatan
Beam energy (keV): 200
Nominal energy range (eV): 0 – 920
Collection semi-angle effective (mrad): 100
Notes: Serial EELS; zero-loss peak intensity = 5.88e8; total elastic int. / zero-loss int. = 0.53; gain change factor = 740; 30 sweeps 20 ms dwell
Slightly oxidized Cr thin film (440 – 940 eV)
Material analyzed: Cr
Related elements: Chromium
Data contributor: Gatan
Beam energy (keV): 200
Nominal energy range (eV): 440 – 940
Collection semi-angle effective (mrad): 100
Notes: Serial EELS; 20 sweeps 20 ms dwell
