Bismuth
Element density: 9.78 g/cm3
Electron configuration: [Xe]4f145d106s26p3
Oxidation states: +3,5
Edges
Explore electron energy loss spectroscopy (EELS) reference spectra, featuring major and minor edges used for elemental identification and chemical state analysis in materials research.
Major edges | |||
|---|---|---|---|
L3 | 13419 |
|
|
M4 | 2688 |
|  |
M5 | 2580 |
| |
O4 | 27 |  | |
O5 | 24 | | |
Minor edges | |||
|---|---|---|---|
L1 | 16388 |
|
|
L2 | 15711 |
|
|
M1 | 3999 |
|
|
M2 | 3696 |
|  |
M3 | 3177 |
|  |
N1 | 938 |
|  |
N2 | 805 |
| |
N3 | 679 |
| |
N4 | 464 |
|  |
N5 | 440 |
| |
N6 | 162 |
|  |
N7 | 157 |
| |
O1 | 159 |
| |
O2 | 117 |  | |
O3 | 93 |  | |
Considerations
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Related spectral data
Bi thin film (0 – 180 eV)
Material analyzed: Bi
Related elements: Bismuth
Data contributor: Gatan
Beam energy (keV): 200
Nominal energy range (eV): 0 – 180
Collection semi-angle effective (mrad): 100
Notes: Serial EELS; 10 sweeps 16.67 ms dwell
Bi thin film (0 – 3880 eV)
Material analyzed: Bi
Related elements: Bismuth
Data contributor: Gatan
Beam energy (keV): 200
Nominal energy range (eV): 0 – 3880
Collection semi-angle effective (mrad): 100
Notes: Serial EELS; zero-loss peak intensity = 4.72e9; total elastic int. / zero-loss int. = 0.29; gain change = 320; 55 sweeps 10 ms dwell
