# Resources

Showing 51-60 of 177
• ### The use of MLLS fitting approach to resolve overlapping edges in the EELS spectrum at the atomic level

Methods

The multiple linear least squares (MLLS) fitting routine provides a very useful means for mapping difference spectra phases or features by reference to their spectral signature. . . .

• ### Review of recent advances in spectrum imaging and its extension to reciprocal space

Methods

Downloadable *.pdf of the application note.

• ### Fast STEM spectrum imaging using simultaneous EELS and EDS in Gatan Microscopy Suite software

Methods

Up to now, researchers performing analytical investigations in the transmission electron microscope typically had to choose between analytical spectroscopy techniques. . . .

• ### Fast simultaneous acquisition of low- and core-loss regions in the EELS spectrum from catalyst particles containing the heavy metals Au and Pd using the GIF Quantum system

Methods

Metals such Pd and Pt have been extensively used in the automotive industry as exhaust gas catalyst for pollution control. . . .

• ### EELS: A tool for investigating biological materials

Methods

Electron energy loss spectroscopy (EELS) is the analysis of the energy distribution of the electrons that have passed through a thin sample and have interacted with it inelastically. . . .

• ### High speed EELS composition analysis, in DualEELS mode, of metal alloy ohmic contacts for the fabrication of III-V MOSFET devices

Methods

As the size of III-V devices decreases, ohmic contacts and their performance becomes increasingly significant. . . .

• ### Atomic level EELS mapping using high energy edges in DualEELS mode

Methods

Over the past few years, with the advancements in aberration-corrected transmission electron microscopy, the spatial resolution in scanning transmission electron microscopy (STEM) has been enormously improved. . . .

• ### Prepare a gain reference

Methods

Step by step instructions on how to prepare a gain reference.

• ### Atomic elemental and chemical analysis of SrTiO3/LaMnO3 multilayers using fast simultaneous EELS and EDS analysis in DigitalMicrograph

Publication
Microscopy Today
Longo, P.; Thomas, P. J.; Aitouchen, A.; Rice, P.; Topuria, T.; Twesten, R. D.

In an age of atomic-scale control of materials and interfaces, the need for high spatial resolution characterization and local bonding is accelerating.

• ### Study of inelastic mean free path of metal nanostructures using energy filtered transmission electron microscopy imaging

Publication
Journal of Microscopy
Ghosh, T.; Bardhan, M.; Bhattacharya, M.; Satpati, B.

We report a simple method for measuring the inelastic mean free path of nanostructures of known geometry using energy filtered transmission electron microscopy imaging.