Structure and chemistry of epitaxial ceria thin films on yttria-stabilized zirconia substrates, studied by high resolution electron microscopy

We have applied aberration-corrected transmission electron microscopy (TEM) imaging and electron energy loss spectroscopy (EELS) to study the structure and chemistry of epitaxial ceria thin films, grown by pulsed laser deposition onto (001) yttria-stabilized zirconia (Y

Published in


Authored by

Sinclair, R.; Lee, S. C.; Shi, Y.; Chueh, W. C.

Publication date

Monday, May 1, 2017
Resource category
Technique category