Fundamentals of electron energy-loss spectroscopy

Electron energy-loss spectroscopy (EELS) is an analytical technique that is based on inelastic scattering of fast electrons in a thin specimen. In a transmission electron microscope (TEM) it can provide structural and chemical information about a specimen, even down to atomic resolution. This review provides an overview of the physical basis and new developments and applications of EELS in scanning transmission electron microscopy.

Published in

EMAS 2015 Workshop

Authored by

Hofer, F.; Schmidt, F. P.; Grogger W.; Kothleitner, G.

Publication date

Tuesday, February 9, 2016
Resource category
Technique category