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EELS
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Introduction
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EELS Atlas
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Getting Started
Sample requirements
TEM setup for analysis
Technique selection
Collection angle considerations
Spectroscopy
Locate the beam
Focus the spectrometer
Acquire a spectrum
Set energy range
Optimize spectrum
DualEELS workflow
Quantification
Choose suitable edges for quantification
Identify edge features in spectrum
Assess sample thickness
Plural scattering and sample thickness
Extract signal
Quantify extracted signal
EFTEM
Basic preparation
Mapping workflow
Zero-loss image
Unfiltered image
Thickness map
Electron spectroscopic imaging
Jump-ratio map
Elemental map
EFTEM MultiMap
Optimize maps
Spectrum Imaging
STEM SI workflow
STEM SI setup
Survey image
Select and survey ROI
Flow control
Visual feedback
Adjustments
EFTEM SI workflow
EFTEM SI setup
Acquisition flow and feedback
EFTEM SI artifact correction
Advanced SI
Software & Scripting
Software & Scripting
Complete information on
Software
and
Scripting
is available at
www.gatan.com
.
Advanced SI